Journal of Northern Agriculture ›› 2025, Vol. 53 ›› Issue (4): 1-10.doi: 10.12190/j.issn.2096-1197.2025.04.01

• Crop genetics and breeding·Corp cultivation •     Next Articles

Genetic variation analysis of lodging resistance-related traits in a wheat recombinant inbred line population and screening of germplasm with strong-stem and high-yield

SU Qihang1, LU Wenying2, SUN Shaoguang1, HE Jie1, SU Yarui1   

  1. 1. School of Life Sciences,Henan University,Kaifeng 475000,China;
    2. Luohe Academy of Agricultural Sciences,Luohe 462000,China
  • Received:2025-06-09 Online:2025-08-20 Published:2025-12-09

Abstract: 【Objective】To identify screening indicators for strong-stem wheat breeding and excavate germplasm resources that combine lodging resistance with high yield potential,thereby providing support for genetic improvement of wheat lodging resistance. 【Methods】A recombinant inbred line(RIL)population was constructed by crossing the strong-stem wheat variety Luomai 163 with Kaimai 18. Eight lodging resistance-related stem traits were measured in the RIL population,including second internode strength,second internode thickness,second internode diameter,second internode length,first internode strength,plant height,fresh weight of single plant,and center of gravity height,along with four yield-related traits:thousand kernel weight,spike length,kernel number per spike,and kernel weight per spike,and by integrating variance analysis and correlation analysis,the key mechanical indicators of stem were identified;by combining cluster analysis,new germplasm lines with superior stem mechanical performance were screened,and microscopic stem structure was observed to elucidate the key factors contributing to excellent stem bending resistance.【Results】The RIL population exhibited transgressive segregation for lodging resistance-related stem traits,with particularly prominent genetic variation potential in second internode strength,second internode thickness,and first internode strength. Second internode diameter,second internode thickness,and second internode strength collectively constituted the key mechanical indicator system for lodging resistance. Cluster analysis identified 12 elite wheat lines combining strong stems and high yield,all of which surpassed the strong-stem parent Luomai 163 in second internode strength. Microstructural analysis further confirmed that their superior bending resistance was closely associated with the thickness of mechanical tissues in the internode.【Conclusion】The 12 selected strong-stem,high-yield germplasm lines provide high-quality parental resources for wheat lodging resistance breeding. Stem key mechanical indicators for evaluating wheat lodging resistance are clarified,and internode mechanical tissue thickness is verified as an important morphological feature influencing stem bending strength.

Key words: Wheat, Recombinant inbred lines, Strong-stem breeding, Stem strength, Mechanical indicators, Germplasm screening

CLC Number: 

  • S512.1